Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (engleski)

· Springer-Verlag Berlin and Heidelberg GmbH & Co. KG · 2010 · meʒuzvezana · 292 stranica

Kod:

Kaupp, Gerd

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Opis
Pojedinosti

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to... pročitati sve