Surface Roughness Study by Atomic Force Microscopy (engleski)

· LAP Lambert Academic Publishing · 2012 · meʒuzvezana · 72 stranica

Sayeed, Md.Abu

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AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for... pročitati sve

Izdavač: LAP Lambert Academic Publishing
Kod:
Godina izdavanja: 2012
Jezik: Engleski jezik
Uvez: Meʒuzvezana
Broj stranica: 72
Širina pakiranja: 15 cm
Visina pakiranja: 22 cm
Dubina pakiranja: 0.4 cm